Events

Abstract: 

This presentation will outline recent work at both making and characterizing nanomagnets at the nanoscale, utilizing the Focused Ion Beam (FIB) and Scanning Transmission Electron Microscope (STEM). It will show how we can rapidly image the magnetic domain state of these nanomagnets, and how the electron lenses of the STEM is used to perform in-situ experiments. It will also cover recent work in imaging magnetic domains in freestanding La0.7Sr0.3MnO3 thin films. Lastly, it will cover some advances in Scanning Precession Electron Diffraction (SPED), where fast pixelated direct electron detectors enable an increase in resolution through acquiring several “segments” of the precession path.