The defence will be in French.
Abstract: The origin of the “abnormal” increase in the critical temperature of aluminum thin films when their thickness tends towards zero remains widely debated. Our point contact spectroscopy measurements suggest significant changes in the Eliashberg function as a function of the thickness of the film but nevertheless they do not directly explain the increase in their critical temperature. These measurements also indicate a strong distribution of the local critical temperature (probably related to a grain size distribution) with the presence of local superconductivity, up to temperatures an order of magnitude higher than the Tc determined by transport !