Dyna ... or "Dynamic x-ray reflectivity (off-or-on resonance regime for isotropic, anisotropic and magnetic multilayers) simulation program"
DYNA is a simulation tool to analyze structural, magnetic and electronic profiles along the growth direction of ultrathin layers.
It simulates conventional x-ray or optical reflectivity, resonant (or "anomalous") x-ray reflectivity, "orbital reflectometry", magnetic resonant x-ray reflectivity with applications to magnetic or anisotropic layers, in hard or soft matter.
Dyna is an on-going open-source project. It uses Matlab environment.
Stéphane Grenier (Inst. Néel)
Jean-Marc Tonnerre (Inst. Néel)
Nicolas Jaouen (Synchrotron Soleil)
Marta Elzo (PhD, Inst. Néel & Soleil, 2009-2012)
Emmanuelle Jal (PhD, Inst. Néel, 2010-2013)
Resonant effects include
In case of use, please cite the reference paper :
M. Elzo, et al., Journal of Magnetism and Magnetic Materials, 324 (2), pp. 105-112 (2012)
Published results using Resonant X-ray Reflectivity analyzed with Dyna.
Plots of the resonant magnetic and charge scattering factors
Definitions of keywords
Some instructions to get you started
Download Dyna’s sources
The reference paper that describes the formalism