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Soutenance de thèse

Jeudi 26 septembre à 14h00,
salle des séminaires, Bat. A

Oratrice : Emmanuelle Jal
"Réflectivité Magnétique Résonante de rayons X mous : une sonde de la distribution d’aimantation complexe au sein de films minces"

Abstract

This thesis deals with depth resolved magnetic profile of u ltrathin Fe layers studied by soft X-ray Resonant Magnetic Reflectivity (SXRMR). This SXRMR technique combines magneto-optic effects to X-ray scattering, allowing the sensitivity to depth resovled magnetic properties. The derived magnetic profile allows to probe the homogeneity of magnetic properties and to reveal interfacial effect. First, we present the study of a thin Fe film grown on a Ag(116) vicinal substrate and covered by Au. This study unreveal a magnetization enhancement of 20 to 30% in the two to three monolayers near both interfaces, whatever the Fe thickness. We have also evidence an inhomogeneity of the out of plane magnetic component at low temperature for sample where the easy magnetization axis is perpendicular to the steps : the out of plane magnetic component is decreased with Fe layer away from the vicinal substrate of Ag. Second, we present the study of a six monolayers thin film of Fe grown on a Cu(100) substrate and covered by Au. Using a new approach to constrain the magnetic parameters, we have highlighted that the temperature dependance of the magnetization is not the same depending ont the position of the monolayer inside the Fe thin film.

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